Publications

Detection and Mitigation of Bias in Under Exposure Estimation for Face Image Quality Assessment

AuthorDörsch, A.; Rathgeb, C.; Grimmer, M.; Busch, C.
Date2024
TypeConference Proceedings
InProc. Intl. Conf. of the Biometrics Special Interest Group (BIOSIG), p.1-5
PublisherIEEE
PartnDoersch-UnderExposureBias-FIQA-BIOSIG-2024