Publications
Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems
| Author | Bayer, F.; Russo, M.; Rathgeb, C. |
|---|---|
| Date | 2025 |
| Type | Conference Proceedings |
| In | Proc. IEEE Intl. Joint Conf. on Biometrics (IJCB) |
| Partn | Bayer-FeatureTruncationDimReduction-IJCB-2025 |
