Publikationen

Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems

AutorBayer, F.; Russo, M.; Rathgeb, C.
Datum2025
ArtConference Proceedings
InProc. IEEE Intl. Joint Conf. on Biometrics (IJCB)
SchlüsselBayer-FeatureTruncationDimReduction-IJCB-2025