Publikationen

Detection and Mitigation of Bias in Under Exposure Estimation

AutorDörsch, A.; Rathgeb, C.; Grimmer, M.; Busch, C.
Datum2024
ArtConference Proceedings
InProc. Intl. Conf. of the Biometrics Special Interest Group (BIOSIG)
PublisherIEEE
SchlüsselDoersch2024a