Publikationen
Detection and Mitigation of Bias in Under Exposure Estimation
Autor | Dörsch, A.; Rathgeb, C.; Grimmer, M.; Busch, C. |
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Datum | 2024 |
Art | Conference Proceedings |
In | Proc. Intl. Conf. of the Biometrics Special Interest Group (BIOSIG) |
Publisher | IEEE |
Schlüssel | Doersch2024a |