Fairness measures for biometric quality assessment
A. D"orsch and T. Schlett and P. Munch and C. Rathgeb and C. Busch
Pattern Recognition. ICPR 2024 Intl. Workshops and Challenges, p.287–298
[Conference Proceedings]

Training-free Dimensionality Reduction via Feature Truncation: Enhancing Efficiency in Privacy-preserving Multi-Biometric Systems
F. Bayer and M. Russo and C. Rathgeb
Proc. IEEE Intl. Joint Conf. on Biometrics (IJCB)
[Conference Proceedings]

AMB-FHE: Adaptive Multi-biometric Fusion with Fully Homomorphic Encryption
F. Bayer and C. Rathgeb
Proc. Intl. Workshop on Biometrics and Forensics (IWBF), p.1–6
[Conference Proceedings]

SoK: On the Physical Security of UOV-Based Signature Schemes
Aulbach, Thomas and Campos, Fabio and Krämer, Juliane
International Conference on Post-Quantum Cryptography (PQCrypto), p.199–231
[Conference Proceedings]